Ion Microbeam System for Surface Analysis

نویسندگان

چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

A Laser Microbeam Implemented at the Heavy-Ion Microbeam Facility

The heavy-ion microbeam is used for targeted irradiation of living cells (in culture) with ions from the UNILAC linear accelerator of GSI [1]. A custom-made epifluorescence microscope is available for beam targeting as well as for observation of proteins (tagged by fluorescent dyes) in sub-compartments of interest. In order to gain better insight into DNA damage repair processes, we intend to e...

متن کامل

The Columbia University single-ion microbeam.

A single-ion microbeam facility has been constructed at the Columbia University Radiological Research Accelerator Facility. The system was designed to deliver defined numbers of helium or hydrogen ions produced by a van de Graaff accelerator, covering a range of LET from 30 to 220 keV/microm, into an area smaller than the nuclei of human cells growing in culture on thin plastic films. The beam ...

متن کامل

Region-specific irradiation system with heavy-ion microbeam for active individuals of Caenorhabditis elegans

Radiation may affect essential functions and behaviors such as locomotion, feeding, learning and memory. Although whole-body irradiation has been shown to reduce motility in the nematode Caenorhabditis elegans, the detailed mechanism responsible for this effect remains unknown. Targeted irradiation of the nerve ring responsible for sensory integration and information processing would allow us t...

متن کامل

Development of a secondary-electron ion-microscope for microbeam diagnostics

We describe a novel secondary-electron ion microscope (SEIM), designed for diagnostics of the upcoming submicron Columbia University charged-particle microbeam. This secondary-electron ion microscope allows much higher resolutions, at higher single particle detection efficiencies, than previously available, for rapid and accurate diagnostics of sub-micron charged-particle beams. Based on ion el...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Shinku

سال: 2007

ISSN: 0559-8516,1880-9413

DOI: 10.3131/jvsj.50.558